• This ISO Category IV, Part 1 (Analysis III) reference book provides in-depth coverage and demonstrations of the diagnostic techniques introduced in "ANALYSIS I and II" texts and also introduces techniques required to continue effective program development.
• Topics in this text important for the optimization of any program include:
◦ (1) "Time Waveform Analysis" shows how this important technique can detect problems which will likely be missed altogether by FFT analysis alone (as well as showing when information contained within such waveforms can be used to verify problem sources detected by spectral analysis). This paper also covers the key procedures the analyst must employ to specify important time waveform setup parameters (i.e., required sampling period (tMAX), recommended number of samples, recommended vibration parameter (acceleration, velocity or displacement) required to detect the problems for which he is looking, etc.).
◦ (2) "How to and How Not to Create Meaningful Narrowband Spectral Envelope Alarms" covers theory on how they should be established and includes real-world examples on how such envelope alarms should be specified for different "families" of machines.
◦ (3) "How to Detect Problems Within DC Motors and Their Controls" reveals surprising results of studies which found nearly 60% of DC motor problems do not originate within the DC motor, but instead within their controls and shows how to isolate the source of the real problems using vibration analysis. A series of real-world case histories are included.
◦ (4) "How to Analyze Low Speed Machines" concentrates on 10 to 300 RPM machines. This in-depth paper covers which analyzers, transducers, measurement parameters and techniques must be used to acquire meaningful data on these machines, along with what measurement setups must be used. Case histories illustrating how such techniques, analyzers and transducers were employed on such low-speed machinery to detect and resolve problems are included.
◦ (5) "How to Analyze High Speed Machines" explains the use of a completely different array of transducers, transducer mounting techniques, analyzers, measurement parameters, etc., to effectively detect problems on this very different class of machines. Real-world case histories are included which were performed on machines generating fault frequencies exceeding 60,000 Hz (3,600,000 CPM).
◦ (6) "How to Analyze Variable-Speed Machines" covers how to effectively evaluate this unique family of machines, both during a one-time diagnostics, as well as within a Condition Monitoring Program. Instrumentation and techniques required to ensure proper diagnostics on these special machine types whose speed may change from one survey to the next, or might literally change while measurements are being made are given. Coverage on how to specify proper frequency spans, spectral band alarms, #FFT lines, #averages, etc. is given, along with real-world examples which illustrate how relatively small changes in speed must be handled to properly evaluate machine condition from one survey to the next.
◦ (7) "High Frequency Enveloped Spectral Analysis Techniques" includes detailed coverage of this relatively new condition monitoring tool including key information pointing out differences in various vendor approaches for each of the following:
▪ (a) "Spike Energy Spectra"
▪ (b) "Amplitude Demodulated Spectra"
▪ (c) "Acceleration Enveloped Spectra"
▪ (d) "SEE Spectra", showing how each of these techniques can be effective by using proper band-pass and high-pass filter choices, and how to interpret their spectral results.